Work

Stresses and deformation processes in thin films on substrates

Year: 1988

Type: article

Source: Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences

DOI: 10.1080/10408438808243734

Authors: Mary F. Doerner, William D. Nix

Institution: Stanford University

Language: English

Topic: Metal and Thin Film Mechanics

Subfield: Mechanics of Materials

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2061976368

FWCI: 19.04

Cites: 112

Cited by: 623

Related to: 10