Focused Ion Beam (FIB): A novel technology for advanced application of micro- and nanoanalysis in geosciences and applied mineralogy
Year: 2004
Type: article
Source: European Journal of Mineralogy
Author: Richard Wirth
Institution: GFZ Helmholtz Centre for Geosciences
Language: English
Subfield: General Materials Science
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2063080801