Work

Dielectric function in HgTe between 8 and 300°K

Year: 1974

Type: article

Source: Physical review. B, Solid state

DOI: 10.1103/physrevb.9.517

Authors: M. Grynberg, R. Le Toullec, M. Balkanski

Institutions: Centre National de la Recherche Scientifique, Laboratoire de physique des Solides, Sorbonne Université

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2063755819

FWCI: 9.016

Cites: 14

Cited by: 160

Related to: 10