Crystal Defects as Source of Anomalous Forward Voltage Increase of 4H-SiC Diodes
Year: 2001
Type: article
Source: Materials science forum
Institutions: Linköping University, Chalmers University of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2064340025