Work

A median run length-based double-sampling X ¯ $$ \overline{X} $$ chart with estimated parameters for minimizing the average sample size

Year: 2015

Type: article

Source: The International Journal of Advanced Manufacturing Technology

DOI: 10.1007/s00170-015-6949-x

Authors: W. L. Teoh, Michael B. C. Khoo, Philippe Castagliola, S. Chakraborti

Institutions: Universiti Tunku Abdul Rahman, Universiti Sains Malaysia, Centre National de la Recherche Scientifique, Université Nantes Angers Le Mans, Université de Nantes, Institut de recherche en communications et cybernétique de Nantes, Nantes Université, University of Alabama

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2064449376

FWCI: 3.036

Cites: 38

Cited by: 23

Related to: 10