Phase retrieval from exactly oversampled diffraction intensity through deconvolution
Year: 2007
Type: article
Abstract: We have shown that, when the linear oversampling ratio $\ensuremath{\geqslant}2$, exactly oversampled diffraction patterns can be directly obtained from measured data through deconvolution. By using computer simulations and experimental data, we have demonstrated that exact oversampling of diffraction patterns distinctively improves the quality of phase retrieval. Furthermore, phase retrieval based on the exact sampling scheme is independent of the oversampling ratio, which can significantly reduce the radiation dosage to the samples. We believe that the present work will contribute to high-quality image reconstruction of materials science samples and biological structures using x-ray diffraction microscopy.
Source: Physical Review B
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2064613256