Work

Depth profiling with positrons of krypton implanted in molybdenum

Year: 1988
Type: article
Abstract: A low-energy positron beam has been used to study krypton implanted into polycrystalline molybdenum foil at an energy of 100 keV and a dose of 1.5*10 16 cm -2 . The change in the Doppler broadening lineshape parameter, as calculated from the integrated difference spectra of the annihilation lineshape, has been measured as a function of incident positron energy up to 12 keV. Using a fixed positron stopping profile, a characteristic defect depth of 171 AA has been found, in reasonable agreement with the estimated krypton profile.
Language: English
Open Access status: bronze
OpenAlex ID: W2064718180
FWCI: 1.411
Cites: 12
Cited by: 7
Related to: 10