Work

Efficient control chart pattern recognition through synergistic and distributed artificial neural networks

Year: 1999

Type: article

Source: Proceedings of the Institution of Mechanical Engineers Part B Journal of Engineering Manufacture

DOI: 10.1243/0954405991517335

Authors: M A Wani, D T Pham

Institutions: Abertay University, University of Wales

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2065173245

FWCI: 2.447

Cites: 12

Cited by: 22

Related to: 10