Low-complexity image denoising based on statistical modeling of wavelet coefficients
Year: 1999
Type: article
Source: IEEE Signal Processing Letters
DOI: 10.1109/97.803428
Institution: University of Illinois Urbana-Champaign
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2065391104