Work

λ/2 Contamination in charge-coupled-device area-detector data

Year: 1997

Type: article

Source: Journal of Applied Crystallography

DOI: 10.1107/s0021889897004214

Authors: K. Kirschbaum, A. Martin, A. A. Pinkerton

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2065570586

FWCI: 2.614

Cites:

Cited by: 48

Related to: 10