Work

A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics

Year: 2003

Type: article

Source: Analytical Chemistry

DOI: 10.1021/ac026338o

Authors: Daniel Weibel, Steve Wong, Nicholas Lockyer, Paul Blenkinsopp, Rowland Hill, John C. Vickerman

Institution: University of Manchester

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: Engineering and Physical Sciences Research Council, National Physical Laboratory

OpenAlex ID: W2065657816

FWCI: 30.55

Cites: 31

Cited by: 554

Related to: 10