New edge-enhanced error diffusion based on the error sum criteria
Year: 1995
Type: conference-paper
DOI: 10.1117/12.207598
Authors: Jae H. Kim, Tae I. Chung, Hyung S. Kim, Kyung S. Son, Yoon-Soo Kim
Institutions: Pusan National University, Samsung Electronics (South Korea)
Language: English
Topic: Image Enhancement Techniques
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2066408961