Probing patterned defects on graphene using differential interference contrast observation
Year: 2015
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.4908289
Authors: Gwangseok Yang, Jihyun Kim
Institution: Korea University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2067049098
