Longitudinal carrier density profiling in semiconductor lasers via spectral analysis of side spontaneous emission
Year: 1996
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.363005
Authors: Edward H. Sargent, Dorothy Pavlidis, Hanan Anis, Nicolae Golinescu, J. M. Xu, Richard Clayton, Hyung B. Kim
Institutions: Nortel (Canada), University of Toronto
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2067199660