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Patents, R&d, and Technological Spillovers at the Firm Level: Some Evidence From Econometric Count Models for Panel Data

Year: 1997

Type: article

Source: Journal of Applied Econometrics

DOI: 10.1002/(sici)1099-1255(199705)12:3<265::aid-jae439>3.0.co;2-j

Author: MICHELE CINCERA

Institution: Université Libre de Bruxelles

Language: English

Topic: Intellectual Property and Patents

Subfield: Management of Technology and Innovation

Field: Business, Management and Accounting

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2067259593

FWCI: 3.451

Cites:

Cited by: 215

Related to: 10