The Extended Range of Reaction-layer Fatigue Susceptibility of Polycrystalline Silicon Thin Films
Year: 2005
Type: article
Authors: O. N. Pierron, C. L. Muhlstein
Institution: Pennsylvania State University
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Pennsylvania State University
OpenAlex ID: W2067556160
