Long-term stability of metal-envelope enclosed Bayard–Alpert ionization gauges
Year: 2012
Type: article
DOI: 10.1116/1.4750482
Authors: James A. Fedchak, Dana R. Defibaugh
Institution: National Institute of Standards and Technology
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W2067634867