Work

Low-Energy Electron Diffraction Study of Silicon Surface Structures

Year: 1962

Type: article

Source: The Journal of Chemical Physics

DOI: 10.1063/1.1733155

Authors: J. J. Lander, J. Morrison

Language: English

Topic: Surface and Thin Film Phenomena

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2068248872

FWCI: 9.123

Cites: 13

Cited by: 278

Related to: 10