Work

A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function

Year: 1978

Type: article

Source: Journal of Applied Crystallography

DOI: 10.1107/s0021889878012601

Author: J. I. Langford

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2068625793

FWCI: 1.393

Cites: 2

Cited by: 632

Related to: 10