Work

Effects of surface roughness and oxide layer on the thermal boundary conductance at aluminum/silicon interfaces

Year: 2010

Type: article

Source: Physical Review B

DOI: 10.1103/physrevb.82.085307

Authors: Patrick E. Hopkins, Leslie M. Phinney, Justin R. Serrano, Thomas E. Beechem

Institution: Sandia National Laboratories

Language: English

Topic: Thermal properties of materials

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: U.S. Department of Energy, National Nuclear Security Administration, Basic Energy Sciences, Laboratory Directed Research and Development, Sandia National Laboratories

OpenAlex ID: W2068798373

FWCI: 4.898

Cites: 42

Cited by: 211

Related to: 9