Work

Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces

Year: 1970

Type: article

Source: Physical review. B, Solid state

DOI: 10.1103/physrevb.1.1382

Authors: A. F. Mayadas, M. Shatzkes

Institutions: IBM Research - Thomas J. Watson Research Center, IBM (United States)

Language: English

Topic: Surface and Thin Film Phenomena

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2069377610

FWCI: 7.93

Cites: 14

Cited by: 2,262

Related to: 10