Work

Processing oscillation diffraction data for very large unit cells with an automatic convolution technique and profile fitting

Year: 1979

Type: article

Source: Journal of Applied Crystallography

DOI: 10.1107/s0021889879012218

Author: M. G. Rossmann

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2070340378

FWCI: 3.121

Cites:

Cited by: 225

Related to: 8