Work

Measuring the Elastic Properties of Thin Polymer Films with the Atomic Force Microscope

Year: 1998

Type: article

Source: Langmuir

DOI: 10.1021/la9713006

Authors: Jan Domke, Manfred Radmacher

Institution: Ludwig-Maximilians-Universität München

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2070663004

FWCI: 7.451

Cites: 20

Cited by: 653

Related to: 10