Year: 2008
Type: article
Abstract: The microwave performance of amorphous dielectric materials at very low temperatures and very low excitation strengths displays significant excess loss. Here, we present the loss tangents of some common amorphous and crystalline dielectrics, measured at low temperatures (T<100mK) with near single-photon excitation energies, E∕ℏω0∼1, using both coplanar waveguide and lumped LC resonators. The loss can be understood using a two-level state defect model. A circuit analysis of the half-wavelength resonators we used is outlined, and the energy dissipation of such a resonator on a multilayered dielectric substrate is theoretically considered.
Source: Applied Physics Letters
DOI: 10.1063/1.2898887
Authors: Aaron D. O’Connell, M. Ansmann, R. C. Bialczak, M. Hofheinz, N. Katz, Erik Lucero, C. McKenney, M. Neeley, H. Wang, E. M. Weig, A. N. Cleland, J. M. Martinis
Institution: University of California, Santa Barbara
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2071236786