Exponential-type error probabilities for multiterminal hypothesis testing
Work
Year: 1989
Type: article
Authors Te Sun Han, K. Kobayashi
Institutions Senshu University, Cornell University
Cites: 14
Cited by: 74
Related to: 10
FWCI: 1.668
Citation percentile (by year/subfield): 96.41
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed