Work

Organic ion imaging using tandem mass spectrometry

Year: 1992

Type: article

Source: Analytical Chemistry

DOI: 10.1021/ac00041a023

Authors: P. J. Todd, R. T. Short, C. C. Grimm, W. M. Holland, S. P. Markey

Institution: Oak Ridge National Laboratory

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: U.S. Department of Energy, Oak Ridge Associated Universities, National Institutes of Health, National Institute of General Medical Sciences, National Center for Research Resources, Basic Energy Sciences

Awards: G2411118425, ORGANIC SECONDARY ION IMAGING

OpenAlex ID: W2072717931

FWCI: 4.024

Cites: 12

Cited by: 12

Related to: 10