Work

A Measurement of Relaxation Time of Dipole and Dielectric Loss Factor in Very Low Frequency by Thermally Stimulated Current

Year: 1973

Type: article

Source: Japanese Journal of Applied Physics

DOI: 10.1143/jjap.12.651

Authors: Taro Hino, Kenji Suzuki, Ken Yamashita

Institution: Tokyo Institute of Technology

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2072745401

FWCI: 2.08

Cites:

Cited by: 25

Related to: 10