Work

Optoelectronic measurement of semiconductor surfaces and interfaces with femtosecond optics

Year: 1992

Type: article

Source: Journal of Applied Physics

DOI: 10.1063/1.350710

Authors: X.-C. Zhang, D. H. Auston

Institution: Columbia University

Language: English

Topic: Terahertz technology and applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2072821301

FWCI: 12.98

Cites: 19

Cited by: 432

Related to: 10