Work

Potentiometry and repair of electrically stressed nanowires using atomic force microscopy

Year: 1998

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.120872

Authors: M. C. Hersam, A. C. F. Hoole, S. J. O’Shea, M. E. Welland

Institution: University of Cambridge

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2073260489

FWCI: 1.714

Cites: 11

Cited by: 54

Related to: 10