Work

The height dependence of image contrast when imaging by non-contact AFM

Year: 2000

Type: article

Source: Surface Science

DOI: 10.1016/s0039-6028(00)00735-4

Authors: I.Yu. Sokolov, G.S. Henderson

Institution: University of Toronto

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2073321813

FWCI:

Cites: 17

Cited by: 3

Related to: 10