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Continuous testing in eclipse
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Year:
2005
Type:
conference-paper
Source:
ACM/IEEE International Conference on Software Engineering: Companion Proceedings (ICSE-Companion)
DOI:
10.1145/1062455.1062600
Authors:
David Saff,
Michael D. Ernst
Institutions:
MIT Computer Science and Artificial Intelligence Laboratory,
Massachusetts Institute of Technology
Language:
English
Topic:
Software Testing and Debugging Techniques
Subfield:
Software
Field:
Computer Science
Domain:
Physical Sciences
Open Access status:
closed
OpenAlex ID:
W2073433262
FWCI:
1.26
Cites:
12
Cited by:
20
Related to:
10