Work

Applying K-means clustering and technology map in Asia Pacific-semiconductors industry analysis

Year: 2011

Type: conference-paper

Source: IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

DOI: 10.1109/ieem.2011.6118074

Authors: Chin Yuan Fan, M. F. Lai, T. Y. Huang, C. M. Huang

Institution: National Institutes of Applied Research

Language: English

Topic: Intellectual Property and Patents

Subfield: Management of Technology and Innovation

Field: Business, Management and Accounting

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2073917830

FWCI: 8.892

Cites: 2

Cited by: 9

Related to: 10