Scanning X-ray interferometry and the silicon lattice parameter: towards relative uncertainty?
Year: 1999
Type: article
Source: The European Physical Journal B
Authors: A. Bergamin, G. Cavagnero, G. Mana, G. Zosi
Institution: University of Turin
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W2074385451