Work

Use of an atomic force microscope to measure surface deformations in polymeric systems

Year: 2002

Type: article

Source: Journal of Adhesion Science and Technology

DOI: 10.1163/156856102760136463

Authors: Michael C. Roggemann, John G. Williams

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Science Foundation, Division of Materials Research

OpenAlex ID: W2074626928

FWCI: 0.375

Cites: 5

Cited by: 6

Related to: 10