Work

Electrical characterization of redox-active molecular monolayers on SiO2 for memory applications

Year: 2003

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.1584088

Authors: Qiliang Li, Shyam Surthi, Guru Mathur, Srivardhan Gowda, Veena Misra, Thomas A. Sorenson, Robert C. Tenent, Werner G. Kuhr, Shun-ichi Tamaru, Jonathan S. Lindsey, Zhiming Liu, David F. Bocian

Institutions: North Carolina State University, University of California, Riverside

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2076165346

FWCI: 6.357

Cites: 12

Cited by: 57

Related to: 10