Work

Method for atomic-layer-resolved measurement of polarization fields by nuclear magnetic resonance

Year: 2000

Type: article

Source: Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

DOI: 10.1116/1.1305287

Authors: James G. Kempf, Daniel P. Weitekamp

Institution: California Institute of Technology

Language: English

Topic: Advanced NMR Techniques and Applications

Subfield: Spectroscopy

Field: Chemistry

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2076242436

FWCI: 1.236

Cites: 26

Cited by: 21

Related to: 10