Work

Probing planar defects in nanoparticle superlattices by 3D small-angle electron diffraction tomography and real space imaging

Year: 2014

Type: article

Abstract: We demonstrate how the acquisition and processing of 3D electron diffraction data can be extended to characterize structural features on the mesoscale, and show how lattice distortions in superlattices of self-assembled spherical Pd nanoparticles can be quantified by three-dimensional small-angle electron diffraction tomography (3D SA-EDT). Transmission electron microscopy real space imaging and 3D SA-EDT reveal a high density of stacking faults that was related to a competition between fcc and hcp arrangements during assembly. Information on the orientation of the stacking faults was used to make analogies between planar defects in the superlattices and Shockley partial dislocations in metallic systems.

Source: Nanoscale

DOI: 10.1039/c4nr04156a

Authors: Arnaud Mayence, Dong Wang, German Salazar-Alvarez, Peter Oleynikov, Lennart Bergström

Institution: Stockholm University

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: hybrid

Funder: Vetenskapsrådet

Award: Automated Quantitative Electron Crystallography for Materials Sciences