Work

Discriminative Deep Metric Learning for Face Verification in the Wild

Year: 2014

Type: conference-paper

Source: IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings

DOI: 10.1109/cvpr.2014.242

Authors: Junlin Hu, Jiwen Lu, Yap-Peng Tan

Institutions: Nanyang Technological University, Advanced Digital Sciences Center

Language: English

Topic: Face recognition and analysis

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: Advanced Digital Sciences Center, Agency for Science, Technology and Research

OpenAlex ID: W2076434944

FWCI: 43.8

Cites: 41

Cited by: 703

Related to: 10