Non-Destructive Optical Techniques for Characterizing Semiconductor Materials and Devices
Year: 1994
Type: article
Source: AT&T Technical Journal
Authors: Gary E. Carver, Mary L. Gray, Jerome Levkoff, Blair W. Miller, Sunil B. Phatak
Institution: AT&T (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2077619201