Work

Misuse of XmR quality control charts for common single parameter probability distributions

Year: 2009

Type: conference-paper

Source: International Conference on Computers and Industrial Engineering

DOI: 10.1109/iccie.2009.5223767

Author: James Benneyan

Institution: Northeastern University

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2077840577

FWCI:

Cites: 15

Cited by: 4

Related to: 10