Work

A reliable approach to charge-pumping measurements in MOS transistors

Year: 1984

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/t-ed.1984.21472

Authors: G. Groeseneken, H.E. Maes, N. Beltran, R.F. De Keersmaecker

Institution: KU Leuven

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2078482863

FWCI: 11.51

Cites: 19

Cited by: 1,358

Related to: 10