A dual-threshold method for photon counting imaging with the EMCCD
Year: 2010
Type: conference-paper
Authors: Beibei Zhou, Qian Chen, Weiji He, Wenwen Zhang
Institution: Nanjing University of Science and Technology
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2078862831
