Work

Probabilistic bounds for complete scanning in non-raster atomic force microscopy

Year: 2011

Type: conference-paper

Source: IEEE Conference on Decision and Control (CDC)

DOI: 10.1109/cdc.2011.6160639

Authors: Peter I. Chang, Sean B. Andersson

Institution: Boston University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W2078876676

FWCI:

Cites: 17

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Related to: 10