Work

A wide slit scanning method for measuring electron and ion beam profiles

Year: 1971
Type: article
Abstract: In order to eliminate the problem of calibration in beam spot size measurements, a wide slit scanning technique has been developed. As the beam scans across the edge of a slit, the ions or electrons are collected, and the resulting signal is displayed on an oscilloscope. This trace is a two-dimensional picture of the convolution of the beam with the slit edge. A mathematical analysis of the signal allows the intensity distribution of the beam to be obtained. Experimental verification of the technique is described.
Author: R B Fair
Institution: Duke University
Language: English
Open Access status: bronze
OpenAlex ID: W2078889308
FWCI: 2.093
Cites: 3
Cited by: 5
Related to: 10