Work

Impact of Surface Roughness on the Effective Dielectric Constant and Subwavelength Image Resolution of Metal-Insulator Stack Lenses

Year: 2011

Type: conference-paper

Source: Frontiers in Optics

DOI: 10.1364/fio.2011.jtua11

Authors: Shivanand, Alon Ludwig, Kevin J. Webb

Institutions: Purdue University West Lafayette, University of Toronto

Language: English

Topic: Metamaterials and Metasurfaces Applications

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2080757964

FWCI:

Cites: 6

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Related to: 10