Submicron deformation field measurements: Part 2. Improved digital image correlation
Year: 1998
Type: article
Source: Experimental Mechanics
DOI: 10.1007/bf02321649
Authors: G. Vendroux, W. G. Knauss
Institution: California Institute of Technology
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2080866586