The use of EM-CCDs on high resolution soft x-ray spectrometers
Year: 2011
Type: conference-paper
DOI: 10.1117/12.895981
Authors: James H. Tutt, Andrew D. Holland, Neil J. Murray, Richard D. Harriss, David J. Hall, Matt Soman, Randall L. McEntaffer, James Endicott
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2080912347