The use of CCDs and EM-CCDs for future soft x-ray spectrometers
Year: 2012
Type: conference-paper
DOI: 10.1117/12.925138
Authors: James H. Tutt, Andrew D. Holland, Neil J. Murray, David J. Hall, James Endicott, Randall L. McEntaffer
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2080992256
