Polarization fatigue in ferroelectric thin films and related materials
Year: 2009
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.3056603
Author: X. J. Lou
Institution: National University of Singapore
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2081056165
