Work

On-chip cancellation of parasitic effects for dielectric permittivity measurement

Year: 2008

Type: conference-paper

Source: ARFTG Microwave Measurement Conference

DOI: 10.1109/arftg.2008.4633317

Authors: Chunrong Song, Pingshan Wang

Institution: Clemson University

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W2081203279

FWCI: 0.474

Cites: 16

Cited by: 5

Related to: 10